Title :
Any Transaction stable design pattern
Author :
Goverdhana, Ram ; Fayad, Mohamed E.
Author_Institution :
Silicon Valley Lab., IBM, San Jose, CA, USA
Abstract :
The traditional concept of a database transaction is based purely on the Atomicity, Consistency, Isolation and Durability (ACID) properties. However, these properties do not hold in the case of the other transactions, which exist in other domains. The concept of a transaction can be perceived differently based on the context of the application within the enterprise, ranging from the traditional transactions to business process transactions. The problem here is that the basic structure of the transaction in multiple contexts such as the database systems or a business process can be the same, however, the properties under which the transaction exists can vary. E.g. Notation of consistency may not be of a great concern in the business transaction process, unlike in the database systems environment. Therefore, why do we need to duplicate the effort of building multiple transaction-processing systems that share similar functional and nonfunctional properties, based on the context? The Transaction stable design pattern would model the solution to the problem based on the new concept of software stability modeling (SSM), such that it can be utilized across any domain, to maximize the reusability and productivity of building stable transaction processing systems across many domain.
Keywords :
data integrity; database management systems; object-oriented methods; software reusability; transaction processing; Transaction stable design pattern; business process transaction; database transaction; software stability modeling; transaction-processing system; Application software; Buildings; Database systems; Educational institutions; Productivity; Relational databases; Silicon; Stability analysis; Transaction databases; Web services;
Conference_Titel :
Information Reuse and Integration, 2004. IRI 2004. Proceedings of the 2004 IEEE International Conference on
Print_ISBN :
0-7803-8819-4
DOI :
10.1109/IRI.2004.1431436