Title :
Long Term Reliability of Photovoltaic Modules
Author :
Wohlgemuth, John H. ; Cunningham, Daniel W. ; Monus, Paul ; Miller, Jay ; Nguyen, Andy
Author_Institution :
BP Solar Int. Inc., Frederick, MD
Abstract :
BP Solar has utilized long term module exposure data and field return data to determine module lifetimes, expected failure rates and to identify failure mechanisms. While outdoor testing is a must for understanding PV reliability, it takes much too long to be of use in determining the effects of changes in materials, processes or equipment. This paper describes how BP Solar utilizes accelerated stress testing to verify the robustness of its new PV products
Keywords :
life testing; reliability; solar cells; PV reliability; accelerated stress testing; expected failure rates; failure mechanism identification; long term reliability; module lifetime determination; outdoor testing; photovoltaic modules; Failure analysis; IEC standards; Life estimation; Materials reliability; Materials testing; Photovoltaic systems; Qualifications; Solar power generation; Stress; Warranties;
Conference_Titel :
Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
Conference_Location :
Waikoloa, HI
Print_ISBN :
1-4244-0017-1
Electronic_ISBN :
1-4244-0017-1
DOI :
10.1109/WCPEC.2006.279905
