DocumentCode :
3207197
Title :
Spectroscopic, scanning laser OBIC and I-V/QE characterizations of browned EVA solar cells
Author :
Pern, F.J. ; Eisgruber, I.L. ; Micheels, R.H.
Author_Institution :
Center for Perfusion Eng., Nat. Renewable Energy Lab., Golden, CO, USA
fYear :
1996
fDate :
13-17 May 1996
Firstpage :
1255
Lastpage :
1258
Abstract :
The effects of ethylene-vinyl acetate (EVA) discoloration due to accelerated field or laboratory exposure on the encapsulated silicon (Si) solar cells or EVA/glass laminates were characterized quantitatively by using noninvasive, nondestructive ultraviolet-visible spectrophotometry, spectrocolorimetry, spectro-fluorometry, scanning laser OBIC (optical beam induced current) spectroscopy and current-voltage (I-V) and quantum efficiency (QE) measurements. The results show that the yellowness index (YI) measured directly over the AR-coated solar cells under the glass superstrate increased from the range of -80 to -90 to the range of -20 to 15 as the EVA changed from clear to brown. The ratio of two fluorescence emission peak areas generally increased from 1.45 to 5.69 as browning increased, but dropped to 4.21 on a darker EVA. For a solar cell with brown EVA in the central region, small-area grating QE measurements and scanning laser OBIC analysis between the brown and clear EVA regions showed that the quantum efficiency loss at 633 nm was 42%-48% of the loss at 488 nm, due to a reduced decrease of transmittance in browned EVA at the longer wavelengths. The portion of the solar cell under the browned EVA showed a decrease of ~36% in efficiency, as compared to the cell efficiency under clear EVA. Transmittance loss at 633 nm was 38% of the loss at 488 nm for a light yellow-brown EVA/glass laminate that showed a small increase of 10 in the yellowness index
Keywords :
OBIC; elemental semiconductors; encapsulation; nondestructive testing; polymers; semiconductor device packaging; semiconductor device testing; silicon; solar cells; spectrochemical analysis; spectrophotometry; 488 nm; 633 nm; I-V measurement; Si; Si solar cells; browned EVA solar cells; discoloration effects; fluorescence emission peaks; quantum efficiency measurements; scanning laser OBIC spectroscopy; semiconductor; spectro-fluorometry; spectrocolorimetry; spectrophotometry; transmittance loss; Acceleration; Current measurement; Glass; Laboratories; Laminates; Optical beams; Photovoltaic cells; Propagation losses; Silicon; Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
Conference_Location :
Washington, DC
ISSN :
0160-8371
Print_ISBN :
0-7803-3166-4
Type :
conf
DOI :
10.1109/PVSC.1996.564360
Filename :
564360
Link To Document :
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