DocumentCode
3207335
Title
Built-in test maturation concepts using test program set and relational database technologies
Author
Sudolsky, Michael D.
Author_Institution
C-17 Autom. Test Syst., McDonnell Douglas Aerosp., Long Beach, CA, USA
fYear
1995
fDate
8-10 Aug. 1995
Firstpage
464
Lastpage
469
Abstract
Continual improvement of avionic built-in test (BIT) is critical to mission readiness and capability. This paper discusses how test program set (TPS) and relational database (RDB) technologies can be used for this purpose. Important aspects for continually improving avionic BIT and TPS operation are discussed.
Keywords
aircraft computers; aircraft testing; automatic test software; built-in self test; fault diagnosis; integrated software; military aircraft; military avionics; military computing; relational databases; ATE; TPS BIT shell; avionic built-in test; built-in test maturation; hybrid shell; military avionics; mission readiness; relational database; test program set; Aerospace electronics; Aerospace testing; Automatic testing; Built-in self-test; Circuit testing; Costs; Displays; Military aircraft; Relational databases; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '95. Systems Readiness: Test Technology for the 21st Century. Conference Record
Conference_Location
Atlanta, GA, USA
Print_ISBN
0-7803-2621-0
Type
conf
DOI
10.1109/AUTEST.1995.522711
Filename
522711
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