DocumentCode
3207971
Title
Shape from focus system
Author
Nayar, Shree K.
Author_Institution
Dept. of Comput. Sci., Columbia Univ., New York, NY, USA
fYear
1992
fDate
15-18 Jun 1992
Firstpage
302
Lastpage
308
Abstract
A shape-from-focus method that uses different focus levels to obtain a sequence of object images is described. A sum-modified-Laplacian operator is developed to provide local measures of the quality of image focus. The operator is applied to the sequence of images of the object to determine a set of focus measures as each image point. A model is developed to describe the variation of focus measure values due to defocusing. This model is used by a depth estimation algorithm to interpolate focus measure values and obtain accurate depth estimates. A fully automated system that has been implemented using an optical microscope and tested on a variety of industrial samples is described
Keywords
focusing; image processing; defocusing; depth estimation algorithm; focus measure values; object images; optical microscope; shape-from-focus; sum-modified-Laplacian operator; Data mining; Focusing; Image analysis; Image sequences; Layout; Optical imaging; Optical microscopy; Rough surfaces; Shape; Surface roughness;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition, 1992. Proceedings CVPR '92., 1992 IEEE Computer Society Conference on
Conference_Location
Champaign, IL
ISSN
1063-6919
Print_ISBN
0-8186-2855-3
Type
conf
DOI
10.1109/CVPR.1992.223259
Filename
223259
Link To Document