• DocumentCode
    320807
  • Title

    Self-adjusting output data compression: An efficient BIST technique for RAMs

  • Author

    Yarmolik, V.N. ; Hellebrand, S. ; Wunderlich, H.-J.

  • Author_Institution
    Dept. of Comput. Syst., Belarussian State Univ. of Inf. & Radioelectron., Minsk, Byelorussia
  • fYear
    1998
  • fDate
    23-26 Feb 1998
  • Firstpage
    173
  • Lastpage
    179
  • Abstract
    After write operations, BIST schemes for RAMs relying on signature analysis must compress the entire memory contents to update the reference signature. This paper introduces a new scheme for output data compression which avoids this overhead while retaining the benefits of signature analysis. The proposed technique is based on a new memory characteristic derived as the module-2 sum of all addresses pointing to non-zero cells. This characteristic can be adjusted concurrently with write operations by simple EXOR-operations on the initial characteristic and on the addresses affected by the change
  • Keywords
    built-in self test; data compression; integrated circuit testing; random-access storage; BIST; EXOR operation; RAM; memory characteristic; self-adjusting output data compression; signature analysis; Automatic testing; Built-in self-test; Circuit testing; Computer architecture; Data compression; Informatics; Production; Random access memory; Read-write memory; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 1998., Proceedings
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-8359-7
  • Type

    conf

  • DOI
    10.1109/DATE.1998.655853
  • Filename
    655853