DocumentCode
320807
Title
Self-adjusting output data compression: An efficient BIST technique for RAMs
Author
Yarmolik, V.N. ; Hellebrand, S. ; Wunderlich, H.-J.
Author_Institution
Dept. of Comput. Syst., Belarussian State Univ. of Inf. & Radioelectron., Minsk, Byelorussia
fYear
1998
fDate
23-26 Feb 1998
Firstpage
173
Lastpage
179
Abstract
After write operations, BIST schemes for RAMs relying on signature analysis must compress the entire memory contents to update the reference signature. This paper introduces a new scheme for output data compression which avoids this overhead while retaining the benefits of signature analysis. The proposed technique is based on a new memory characteristic derived as the module-2 sum of all addresses pointing to non-zero cells. This characteristic can be adjusted concurrently with write operations by simple EXOR-operations on the initial characteristic and on the addresses affected by the change
Keywords
built-in self test; data compression; integrated circuit testing; random-access storage; BIST; EXOR operation; RAM; memory characteristic; self-adjusting output data compression; signature analysis; Automatic testing; Built-in self-test; Circuit testing; Computer architecture; Data compression; Informatics; Production; Random access memory; Read-write memory; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 1998., Proceedings
Conference_Location
Paris
Print_ISBN
0-8186-8359-7
Type
conf
DOI
10.1109/DATE.1998.655853
Filename
655853
Link To Document