• DocumentCode
    3208264
  • Title

    Long-term performance and reliability of crystalline silicon photovoltaic modules

  • Author

    Atmaram, Gobind H. ; Ventre, Gerard G. ; Maytrott, Craig W. ; Dunlop, James P. ; Swamy, Ramachandran

  • Author_Institution
    Florida Solar Energy Center, Cocoa, FL, USA
  • fYear
    1996
  • fDate
    13-17 May 1996
  • Firstpage
    1279
  • Lastpage
    1282
  • Abstract
    This study evaluates the long-term effects of outdoor exposure and high voltage operation on the performance and reliability of flat-plate crystalline silicon photovoltaic modules. The modules included Mobil Ra-180 EFG ribbon silicon modules, Photowatt MU-7061 and ARCO 16-2000 single-crystal silicon modules with round cells. In all three types of photovoltaic modules (Mobil, Photowatt and ARCO), no significant power loss occurred over more than ten years of outdoor operation in the warm, humid and ocean-salt environments of coastal Florida, USA. However, the wet insulation resistance values of a majority of the modules in all three types were lower than the values recommended in IEEE Standard 1262. The encapsulant discoloration, observed in all three types of modules, generally did not appear to have any effect on the modules´ power generation
  • Keywords
    elemental semiconductors; encapsulation; semiconductor device packaging; semiconductor device reliability; semiconductor device testing; silicon; solar cell arrays; solar cells; IEEE Standard 1262; Si; USA; crystalline Si photovoltaic modules; encapsulant discoloration; high voltage operation; long-term performance; long-term reliability; outdoor exposure; outdoor operation; power generation; wet insulation resistance; Crystallization; Electrical resistance measurement; Insulation; Photovoltaic systems; Power measurement; Safety; Silicon; Solar power generation; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1996., Conference Record of the Twenty Fifth IEEE
  • Conference_Location
    Washington, DC
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3166-4
  • Type

    conf

  • DOI
    10.1109/PVSC.1996.564366
  • Filename
    564366