DocumentCode
320904
Title
Current-induced degradation of isotropically conductive adhesives
Author
Kotthaus, S. ; Haug, R. ; Schäfer, H. ; Hennemann, O.-D.
Author_Institution
Robert Bosch GmbH, Stuttgart, Germany
fYear
1997
fDate
26-30 Oct 1997
Firstpage
64
Lastpage
69
Abstract
The application scope of conductive adhesives increases continuously, requiring new and improved properties. In general, isotropic conductivity is achieved by loading a resistive polymer (mainly epoxy resins) with 70-80 wt% metal filler particles. During cure, resin shrinkage lowers contact resistance between neighbouring particles, giving a conductive 3D network. However, at high currents, local current density at neighbouring particle contact spots may be a limiting factor. Due to the filler content percolation effect, electrons flow through very small contact spot areas, so local current density cannot be calculated from applied current and adhesive bond geometry. This may lead to electromigration, resulting in Ag atom transport within the filler particles and then by diffusion through the polymer. This effect occurs even if self-heating is neglected. In this study, early-stage resistance degradation for bisphenol-A type and cycloaliphalic resins, loaded with Ag flakes and porous Ag powder respectively, is examined using adhesive stripe samples on FR-4. Resistance is measured by a four-point technique. Samples are held at constant temperature in an inert liquid, and a pulsed DC-current is applied. Tests with temperatures from 80-130°C and 2-33 A/mm2 current densities are performed. A linear increase or decrease in resistance with time is observed for flake and porous Ag filled adhesives, respectively, due to current application, whereby a sintering process for the porous Ag must be taken into account. Current density and temperature dependences for various parameters are discussed; a degradation model is proposed
Keywords
adhesion; conducting polymers; contact resistance; current density; electromigration; failure analysis; filled polymers; heat treatment; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; particle reinforced composites; percolation; powder technology; powders; shrinkage; silver; sintering; thermal analysis; 80 to 130 C; Ag; Ag atom transport; Ag flakes; FR-4 substrate; adhesive bond geometry; adhesive stripe samples; applied current; bisphenol-A type epoxy resin; conductive 3D network; conductive adhesives; contact resistance; contact spot areas; curing; current-induced degradation; cycloaliphalic epoxy resin; degradation model; diffusion; electromigration; electron flow; epoxy resins; filler content percolation effect; flake Ag filled adhesives; four-point resistance measurement technique; isotropic conductivity; isotropically conductive adhesives; local current density; metal filler particles; particle contact spots; porous Ag filled adhesives; porous Ag powder; pulsed DC-current; resin shrinkage; resistance; resistive polymer loading; self-heating; sintering process; test current densities; test temperature; Bonding; Conductive adhesives; Conductivity; Contact resistance; Current density; Degradation; Electrons; Epoxy resins; Polymers; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Polymeric Electronics Packaging, 1997. Proceedings., The First IEEE International Symposium on
Conference_Location
Norrkoping
Print_ISBN
0-7803-3865-0
Type
conf
DOI
10.1109/PEP.1997.656474
Filename
656474
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