DocumentCode :
3209306
Title :
An Improved Path-Based Reliability Prediction Model for Component-Based Embedded Software
Author :
Li, Changde ; Zhou, Xingshe ; Wang, Yuying ; Dong, Yunwei
Author_Institution :
Sch. of Comput. Sci. & Eng., Northwestern Polytech. Univ., Xi´´an, China
fYear :
2009
fDate :
17-19 Dec. 2009
Firstpage :
301
Lastpage :
307
Abstract :
With the increasing use of component-based software development in embedded systems, reliability prediction for such software has become a challenge. This paper consequently contributes to this problem through an improved path-based reliability prediction model. We use Hoare´s Communicating Sequential Processes (CSP) to specify the software architecture. So the execution path could be derived from CSP trace model accurately and completely. A probabilistic model named Component Transition Graph (CTG) is constructed. Based on CTG, the execution frequency of path is calculated. By analyzing the structure of loop in the architecture, we propose a solution for reliability estimation containing loops in path which is the most important contribution of our work. The reliability prediction and sensitivity analysis techniques and how the model could be used to identify the critical component interfaces and transition are illustrated with examples.
Keywords :
communicating sequential processes; embedded systems; graph theory; object-oriented programming; probability; software architecture; software reliability; CSP; CSP trace model; Hoare communicating sequential processes; component transition graph; component-based embedded software; component-based software development; embedded systems; execution path frequency; path-based reliability prediction model; probabilistic model; reliability prediction; sensitivity analysis techniques; software architecture; Application software; Assembly; Computer architecture; Computer science; Embedded software; Embedded system; Predictive models; Programming; Sensitivity analysis; Software architecture; CSP; component; component transition graph; path-based model; reliability prediction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frontier of Computer Science and Technology, 2009. FCST '09. Fourth International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3932-4
Electronic_ISBN :
978-1-4244-5467-9
Type :
conf
DOI :
10.1109/FCST.2009.83
Filename :
5392903
Link To Document :
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