XPS and LEED analyses on the extremely low work function surface of W(100) modified by yttrium oxide.

Author

Kawakubo, Takashi ; Shimoyama, Yusuke ; Nakane, Hideaki ; Adachi, Hiroshi

Author_Institution

Muroran Inst. of Technol., Muroran

fYear

2007

fDate

8-12 July 2007

Firstpage

20

Lastpage

21

Abstract

XPS and LEED analyses have been done for tungsten (100) surface modified by use of Y₂O₃. No shift in Y-3d XPS peak is observed for heat treatment, suggesting that Y-O composite cannot be expected, in contrast to the case of ZrO/W(100) surface for which Zr-O composite is believed to exist. The particular LEED pattern is also different with each other: p(2X1) double domain pattern for YO/W(100) and c(4X2) double domain pattern for ZrO/W(100).

Keywords

X-ray photoelectron spectra; composite materials; heat treatment; low energy electron diffraction; tungsten; yttrium compounds; zirconium compounds; LEED analysis; W; XPS analysis; Y-O composites; Y₂O₃; ZrO composites; ZrO-W; double domain pattern; heat treatment; tungsten surface modification; yttrium oxide; Chemicals; Electron emission; Heat treatment; Heating; Industrial electronics; Needles; Powders; Surface treatment; Tungsten; Yttrium;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International

Conference_Location

Chicago, IL

Print_ISBN

978-1-4244-1133-7

Electronic_ISBN

978-1-4244-1134-4

Type

conf

DOI

10.1109/IVNC.2007.4480915

Filename

4480915