• DocumentCode
    3209844
  • Title

    Energy exchange in field emission from semiconductors

  • Author

    Chung, Moon S. ; Jang, Yu.J. ; Mayer, A. ; Cutler, Paul H. ; Miskovsky, Nicholas M.

  • Author_Institution
    Univ. of Ulsan, Ulsan
  • fYear
    2007
  • fDate
    8-12 July 2007
  • Firstpage
    56
  • Lastpage
    57
  • Abstract
    In order to evaluate the energy exchange in field emission, we have investigated the replacement of electrons. The occupied energy levels near the surface are emptied by tunneling of electron through the surface barrier. They are reoccupied with electrons supplied from the back contact. This replacement process in the emitting region is not usually considered in the description of field emission. However, it has to be taken into account to evaluate the energy gain or loss of the cathode during the complete process of field emission. This energy exchange, the so-called Nottingham effect, changes from one of heating to one of cooling at the inversion temperature where the net energy exchange per electron is zero.Recently we have formulated the replacement process for semiconductor. The energy exchange is the difference between the average energies of the field and replacement electrons.
  • Keywords
    carrier density; charge transfer states; electron density; electron field emission; tunnelling; Nottingham effect; energy exchange; field electrons; replacement electrons; replacement process; semiconductors field emission; Cathodes; Cooling; Electron emission; Energy exchange; Energy states; Heating; Moon; Physics; Temperature; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4244-1133-7
  • Electronic_ISBN
    978-1-4244-1134-4
  • Type

    conf

  • DOI
    10.1109/IVNC.2007.4480930
  • Filename
    4480930