Title :
Field emission observation of carbon nanosheet thin film by photoelectron emission microscopy (PEEM)
Author :
Hou, Kun ; Kordesch, Martin E. ; Arp, Uwe ; Zhu, Mingyao ; Outlaw, Ronald A. ; Miraldo, Peter ; Holloway, Brian C. ; Manos, Dennis
Author_Institution :
Coll. of William & Mary, Williamsburg
Abstract :
In this study, the field emission characterization of carbon nanosheet thin film was conducted using a diode configuration with an anode-cathode distance of 254 mum. Photoelectron emission microscopy (PEEM) was used to investigate the field emission uniformity over the surfaces of carbon nanosheet thin films.
Keywords :
carbon; field emission; nanostructured materials; photoelectron microscopy; thin films; C; carbon nanosheet thin film; diode configuration; distance 254 mum; field emission characterization; field emission uniformity; photoelectron emission microscopy; Carbon dioxide; Cathodes; Current measurement; Nanoscale devices; Optical films; Optical microscopy; Photoelectron microscopy; Physics; Scanning electron microscopy; Transistors;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4244-1133-7
Electronic_ISBN :
978-1-4244-1134-4
DOI :
10.1109/IVNC.2007.4480963
