Title :
An efficient algorithm-based fault tolerance design using extended rearranged Hamming checksum
Author :
Oh, Choong Gun ; Youn, Hee Yong ; Raj, Vijay K.
Author_Institution :
Dept. of Comput. Sci. Eng., Texas Univ., Arlington, TX, USA
Abstract :
Fault tolerance has been an important issue for systems involving intensive computations using a large number of processing elements. To effectively tolerate operation time faults in the systems, algorithm-based fault tolerance designs have been developed. Extended rearranged Hamming checksum scheme is proposed as an algorithm-based fault tolerance design. It is based on the rearranged Hamming checksum code with newly introduced negative elements in the checksum matrix. The overflow and round-off error probability of the scheme are greatly reduced compared to earlier designs, while both time latency and hardware overheads are small. Two important matrix computations are selected to show how the scheme works. Performance of the proposed design is evaluated and compared with those of existing schemes through computer simulation
Keywords :
Hamming codes; VLSI; fault tolerant computing; roundoff errors; algorithm-based fault tolerance design; checksum matrix; computer simulation; extended rearranged Hamming checksum; hardware overheads; negative elements; overflow error probability; processing elements; round-off error probability; time latency; Algorithm design and analysis; Computer science; Decoding; Design engineering; Fault tolerance; Fault tolerant systems; Hardware; Linear matrix inequalities; Roundoff errors; Very large scale integration;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1992. Proceedings., 1992 IEEE International Workshop on
Conference_Location :
Dallas, TX
Print_ISBN :
0-8186-2837-5
DOI :
10.1109/DFTVS.1992.224351