DocumentCode :
3210788
Title :
Investigation of optimum junction depth of InSb Infrared Photodiode
Author :
Asad, M. ; Ghorbanzadeh, M. ; Sareminia, Gh ; Fathipour, M.
Author_Institution :
Nanotechnol. Res. Center, Shiraz Univ., Shiraz, Iran
fYear :
2012
fDate :
15-17 May 2012
Firstpage :
260
Lastpage :
262
Abstract :
Junction depth plays an important role in determining reverse saturation current (Is) and the quantum efficiency η of a detector. In order to reduce the Is and increase the η, the thickness of p-type region is made as thin as possible. To evaluate the effect of junction depth on quantum efficiency and reverse saturation current we calculated the efficiency and fabricate InSb PV detector, and the effect of junction depth on performance of this type of detector acquired.
Keywords :
indium compounds; infrared detectors; photodetectors; photodiodes; InSb; PV detector; infrared photodiode; optimum junction depth; p-type region thickness; quantum efficiency; reverse saturation current; Pollution measurement; Presses; Diffusion; InSb PV detector; Junction depth; Reverse saturation current;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Engineering (ICEE), 2012 20th Iranian Conference on
Conference_Location :
Tehran
Print_ISBN :
978-1-4673-1149-6
Type :
conf
DOI :
10.1109/IranianCEE.2012.6292364
Filename :
6292364
Link To Document :
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