DocumentCode :
3210807
Title :
Wavelet analysis to fabric defects detection in weaving processes
Author :
Kim, Sungshin ; Lee, Man Hyung ; Woo, Kwang-Bang
Author_Institution :
Dept. of Electr. Eng., Pusan Nat. Univ., South Korea
Volume :
3
fYear :
1999
fDate :
1999
Firstpage :
1406
Abstract :
The current procedure for the determination of fabric defects in the textile industry is performed by humans in the offline stage. The advantage of an online inspection system is not only defect detection and identification, but also quality improvement by a feedback control loop to adjust setpoints. This paper introduces a vision-based online fabric inspection methodology of woven textile fabrics. The proposed inspection system consists of hardware and software components. The hardware components consist of CCD array cameras, a frame grabber and appropriate illumination. The software routines capitalize upon vertical and horizontal scanning algorithms to reduce the 2-D image into a stream of 1-D data. The wavelet transform is used next to extract features that are characteristic of a particular defect. The signal to noise ratio (SNR) calculation based on the results of the wavelet transform is performed to measure any defects. The defect declaration is carried out by employing SNRs and scanning methods. Learning routines are called upon to optimize the wavelet coefficients. Test results from different types of defect and different styles of fabric demonstrate the effectiveness of the proposed inspection system
Keywords :
automatic optical inspection; computer vision; feature extraction; feedback; learning (artificial intelligence); process control; textile industry; wavelet transforms; CCD array cameras; SNRs; defect identification; fabric defects detection; feature extraction; frame grabber; learning routines; online inspection system; scanning algorithms; scanning methods; signal to noise ratio; software routines; textile industry; wavelet analysis; wavelet transform; weaving processes; Fabrics; Feedback control; Hardware; Humans; Inspection; Signal to noise ratio; Textile industry; Wavelet analysis; Wavelet transforms; Weaving;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 1999. ISIE '99. Proceedings of the IEEE International Symposium on
Conference_Location :
Bled
Print_ISBN :
0-7803-5662-4
Type :
conf
DOI :
10.1109/ISIE.1999.796918
Filename :
796918
Link To Document :
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