DocumentCode :
3211351
Title :
Syndrome testable design software package, instrument and Syndrome testing system for sequential circuits
Author :
Wang, Fanglei ; Wang, Jijie
Author_Institution :
Shanghai Univ. of Sci. & Technol., China
fYear :
1992
fDate :
26-27 Nov 1992
Firstpage :
218
Lastpage :
222
Abstract :
Syndrome testing and Syndrome design for testability are very difficult to put into practice. The authors propose some research results which can solve these difficulties. They include computer aid Syndrome testable design, Syndrome structured design for testability and multiple Syndrome testing instrument, etc. These techniques open the way for putting Syndrome testing and Syndrome design for testability into practice
Keywords :
automatic test equipment; automatic testing; design for testability; logic CAD; logic testing; sequential circuits; software packages; Syndrome design for testability; Syndrome structured design; Syndrome testing system; multiple Syndrome testing instrument; sequential circuits; software package; Circuit testing; Combinational circuits; Design for testability; Instruments; Sequential analysis; Sequential circuits; Software design; Software packages; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location :
Hiroshima
Print_ISBN :
0-8186-2985-1
Type :
conf
DOI :
10.1109/ATS.1992.224405
Filename :
224405
Link To Document :
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