DocumentCode :
3211436
Title :
Synthesis for testability of PLA based finite state machines
Author :
Avedillo, M.J. ; Quintana, J.M. ; Huertas, J.L.
Author_Institution :
Dept. de Diseno Analogico, CNM, Sevilla, Spain
fYear :
1992
fDate :
26-27 Nov 1992
Firstpage :
194
Lastpage :
199
Abstract :
A new procedure for the synthesis of easily testable PLA-based finite state machines is presented. All combinational irredundant crosspoint faults in the PLA implementing the combinational component of the machine are testable. The machines produced have short machine-independent justification sequences for each state. The maximum length of these sequences is nv. A unit length sequence verifies that the machine has been actually placed in the reset state after the application of the reset input. The authors have developed an algorithm which does not use fault simulation. Combinational fault simulation is introduced in order to reduce the number of test vectors needed. There is an area overhead associated to the increment in testability. These area penalties have been shown to be smaller for larger machines. The scheme reduces the area overhead of similar approaches previously reported
Keywords :
combinatorial circuits; design for testability; fault location; finite state machines; logic arrays; logic design; PLA; area overhead; area penalties; combinational irredundant crosspoint faults; finite state machines; logic design; logic synthesis; synthesis; testability; unit length sequence; Automata; Benchmark testing; Clocks; Fault detection; Fault diagnosis; Hardware; Logic testing; Programmable logic arrays; Sequential analysis; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location :
Hiroshima
Print_ISBN :
0-8186-2985-1
Type :
conf
DOI :
10.1109/ATS.1992.224409
Filename :
224409
Link To Document :
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