Title :
Fault simulation based on value difference
Author :
Wu, Ching Ping ; Lee, Chung Len ; Shen, Wen Zen
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsin-Chu, Taiwan
Abstract :
The authors present a new concept: value difference, which is the difference of the faulty signal from the normal signal on a line, for fault simulation. Due to its saving of the event number, up to 41% saving of the simulation time is achieved. Both theoretical analysis and experimental result are provided
Keywords :
digital simulation; fault location; logic testing; fault simulation; logic testing; performance evaluation; value difference; Analytical models; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit simulation; Computational modeling; Discrete event simulation; Logic testing; Pattern analysis; System testing;
Conference_Titel :
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location :
Hiroshima
Print_ISBN :
0-8186-2985-1
DOI :
10.1109/ATS.1992.224431
