Spectral Modification of the LFSR - Sequence for Test Patterns Generation Improvement

Author

Porwik, P. ; Wróbel, K.

Author_Institution

Univ. of Silesia, Katowice

fYear

2007

fDate

21-23 June 2007

Firstpage

539

Lastpage

544

Abstract

In the paper some modification of the LFSR sequences was proposed. Modified, predictable test pattern sequences are estimated on the basis of spectral analysis of the past sequences. Experimental results show that the number of the test vectors can be significantly reduced if classical LFSR register approach by spectral analysis will be aided. Obtained results of benchmarks circuits testing demonstrate the effectiveness of the proposed technique in which high fault coverage was achieved.

Keywords

automatic test pattern generation; benchmark testing; binary sequences; integrated circuit testing; spectral analysis; LFSR register approach; LFSR sequences; VLSI; Walsh functions; benchmarks circuits testing; fault coverage; linear feedback shift register; predictable test pattern sequences estimation; spectral analysis; test patterns generation; Automatic test pattern generation; Benchmark testing; Built-in self-test; Circuit faults; Circuit testing; Polynomials; Registers; Spectral analysis; State feedback; Test pattern generators; Circuits testing; Faults coverage; LFSR technique; Spectral analysis; Test patterns; Walsh functions;

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed Design of Integrated Circuits and Systems, 2007. MIXDES '07. 14th International Conference on

Conference_Location

Ciechocinek

Print_ISBN

83-922632-9-4

Electronic_ISBN

83-922632-9-4

Type

conf

DOI

10.1109/MIXDES.2007.4286221

Filename

4286221