Title :
Proceedings. First Asian Test Symposium (ATS ´92) (Cat. No.TH0458-0)
Abstract :
The following topics are dealt with: verification and compaction; fault simulation; test pattern generation; functional testing; one-line testing; diagnostics; testability techniques; and built-in self-test (BIST)
Keywords :
automatic testing; built-in self test; digital simulation; fault location; formal verification; integrated circuit testing; logic testing; ATE; BIST; IC testing; automatic testing; built-in self-test; compaction; diagnostics; fault simulation; functional testing; one-line testing; test pattern generation; testability; verification;
Conference_Titel :
Test Symposium, 1992. (ATS '92), Proceedings., First Asian (Cat. No.TH0458-0)
Conference_Location :
Hiroshima, Japan
Print_ISBN :
0-8186-2985-1
DOI :
10.1109/ATS.1992.224455
