Best Paper Award - A new reliability model for post-cycling charge retention of flash memories

fYear

2004

fDate

25-29 April 2004

Firstpage

743

Lastpage

743

Abstract

The award winners and the titles of their award winning papers are listed.

Keywords

Awards;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International

Conference_Location

Phoenix, AZ, USA

Print_ISBN

0-7803-8315-X

Type

conf

DOI

10.1109/RELPHY.2004.1315475

Filename

1315475

Link To Document