Simulation and Automation of the EEBI Test at ALS

The Errant Electron Beam Interlock (EEBI) is a system that protects the vacuum chamber of the Advanced Light Source (ALS) [1] from synchrotron light damage should the orbit, through a superconducting bend magnet (superbend) [2], become distorted. The EEBI system monitors the vertical beam position on two beam position monitors (BPMs), one upstream and the other downstream, of the superbend and dumps the stored beam if the orbit exceeds preset limits in either offset or angle. Discussed are the modelling studies carried out to determine how to create a large vertical bump, both for performing the test and implementing the automated test software.