Title :
Sapphire and rutile dielectric resonators for measurements of surface resistance of superconducting thin films
Author :
Mazierska, Janina
Author_Institution :
Dept. of Electr. & Comput. Eng., James Cook Univ. of North Queensland, Townsville, Qld., Australia
Abstract :
Dielectric resonators are widely used for measurements of surface resistance of High Temperature Superconducting films for cellular and PCS filters. This paper discusses properties of two 10 GHz resonators; a sapphire Hakki-Coleman resonator and an open ended rutile resonator in terms of their suitability and accuracy for microwave characterisation of HTS films
Keywords :
dielectric resonators; electric resistance measurement; high-temperature superconductors; microstrip filters; microwave filters; microwave measurement; superconducting microwave devices; superconducting thin films; 10 GHz; Hakki-Coleman resonator; PCS filters; TiO2; cellular filters; dielectric resonators; high temperature superconducting films; microwave characterisation; open ended rutile resonator; superconducting thin films; surface resistance measurement; Copper; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Electrical resistance measurement; Equations; High temperature superconductors; Loss measurement; Superconducting films; Surface resistance;
Conference_Titel :
Microwave Conference Proceedings, 1997. APMC '97, 1997 Asia-Pacific
Print_ISBN :
962-442-117-X
DOI :
10.1109/APMC.1997.659321
