• DocumentCode
    3216337
  • Title

    An application framework for the IEEE 1588 standard

  • Author

    Song, Eugene Y. ; Lee, Kang

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD
  • fYear
    2008
  • fDate
    22-26 Sept. 2008
  • Firstpage
    23
  • Lastpage
    28
  • Abstract
    This paper introduces an application framework for the Institute of Electrical and Electronics Engineers (IEEE) 1588 standard. This application framework, developed at the National Institute of Standards and Technology (NIST), consists of five layers: hardware layer, operating system layer, middleware and tools layer, IEEE 1588 layer, and application layer. A prototype application system has been developed based on the established IEEE 1588 application framework using the Unified Modeling Language (UML) tool. A case study of the IEEE 1588 delay request-response mechanism based on the application framework is presented. The object-oriented application framework can ease integration and simplify the development of new IEEE 1588 applications by reducing the amount of time and errors to design and develop the IEEE 1588 standard infrastructure. Another benefit of this application framework is to enable developers to achieve standards compliance more readily.
  • Keywords
    IEEE standards; Unified Modeling Language; middleware; object-oriented programming; operating systems (computers); IEEE 1588 delay request-response mechanism; IEEE 1588 standard; UML; Unified Modeling Language; hardware layer; object-oriented application framework; operating system layer; Application software; Clocks; Communication system control; Control systems; NIST; Object oriented modeling; Real time systems; Standards development; Synchronization; Unified modeling language; Application framework; IEEE 1588; Object-oriented framework; UML;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Clock Synchronization for Measurement, Control and Communication, 2008. ISPCS 2008. IEEE International Symposium on
  • Conference_Location
    Ann Arbor, MI
  • Print_ISBN
    978-1-4244-2274-6
  • Electronic_ISBN
    978-1-4244-2275-3
  • Type

    conf

  • DOI
    10.1109/ISPCS.2008.4659207
  • Filename
    4659207