DocumentCode
3217502
Title
UV image intensifier resolution test based on reflective and coaxial optical system
Author
Debin Li ; Rongguo Fu ; Yongfu Yang
Author_Institution
Inst. of Electron. Eng. & Optoelectron. Technol., Nanjing Univ. of Sci. & Technol., Nanjing, China
fYear
2010
fDate
14-16 Oct. 2010
Firstpage
264
Lastpage
265
Abstract
Image intensifier tubes are opto-electronic vacuum devices that amplify very low levels of light into visible levels for the human eye. Resolution which is the ability of an image intensifier or night vision system to distinguish between objects close together is one of the most important parameters. This paper presents a UV image intensifier resolution test equipment. At present UV image intensifier resolution test is still a difficult point, there are mainly two reasons: First, UV is absorbed when transmit the ordinary optical glass. Although UBK-7 and UK-5 have been developed to reduce the absorption in the spectral range of 0.2 μm~0.4 μm, but the absorption is still serious in the 0.3μm. That limits the resolution test. The resolution test based on the transmission optical system can only achieved 40lp/mm. Therefore, based on material reason, the test equipment must use reflective optical system; Second, UV light has the characteristic of scattered in the air. The target image is strongly scattered in the transmission process, leading to the resolution go down soon. So the optical path must be short to reduce scatter.
Keywords
image intensifiers; light absorption; light reflection; light transmission; optical design techniques; optical glass; optical testing; optoelectronic devices; ultraviolet sources; UBK-7; UK-5; UV image intensifier resolution test; UV light; absorption spectra; coaxial optical system; light transmission; optical glass; optical path; optoelectronic vacuum devices; reflective optical system; very low light levels; wavelength 0.2 mum to 0.4 mum; Image resolution; Optical imaging; Optical reflection;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location
Nanjing
Print_ISBN
978-1-4244-6645-0
Type
conf
DOI
10.1109/IVESC.2010.5644260
Filename
5644260
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