• DocumentCode
    3218121
  • Title

    Analysis of pi-point instability in an asymmetric helical slow-wave structure in helix traveling wave tubes

  • Author

    Joo, Y.D. ; Sinha, A.K. ; Basu, B.N. ; Park, G.S.

  • Author_Institution
    Sch. of Phys., Seoul Nat. Univ., South Korea
  • fYear
    2004
  • fDate
    27-29 April 2004
  • Firstpage
    120
  • Lastpage
    121
  • Abstract
    The energy exchange takes place between the linear electron beam and the electromagnetic wave propagating in the helix (E.I. Lien, IEDM Tech. Digest, pp. 412-415, 1979; T. Onodera, IEEE Trans. ED, vol. 35, no 10, 1988; B. Levush, Int. Vacuum Electron. Conf., pp. 71-72, 2002; B. N. Basu, Electromagnetic Theory and Applications in Beam-Wave Electronics, World Publ. Co. Inc. 1996; J. R. Pierce, Traveling Wave Tubes, D Van Nostrand, New York, 1950; L. N. Loshakov et al., Radio Eng. Electron Phys., vol. 13, 1968). For the efficient operation of the device, the beam velocity should be nearly synchronous with the axial phase velocity of the wave over the frequency range. Thus, the dispersion characteristics of helix SWS become of great importance. In this study, rigorous field analysis (B.N. Basu, et al., J. Appl. Phys., vol. 58, no. 9, 1985) of a general asymmetric helical SWS was done.
  • Keywords
    dispersion (wave); electromagnetic wave propagation; electron beams; slow wave structures; stability; travelling wave tubes; asymmetric helical SWS; asymmetric helical slow-wave structure; beam velocity; dispersion characteristics; efficient operation; energy exchange; field analysis; helix SWS; helix traveling wave tubes; linear electron beam; pi-point instability analysis; propagating electromagnetic wave; wave axial phase velocity; wave frequency range; Coupling circuits; Dielectric constant; Electromagnetic analysis; Electron tubes; Energy exchange; Equations; Frequency; Physics; Power engineering and energy; Propagation constant;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2004. IVEC 2004. Fifth IEEE International
  • Print_ISBN
    0-7803-8261-7
  • Type

    conf

  • DOI
    10.1109/IVELEC.2004.1316228
  • Filename
    1316228