• DocumentCode
    3218348
  • Title

    Design Study of A New Beam Separator for PEEM3

  • Author

    Wan, W. ; Feng, J. ; Padmore, H.A.

  • Author_Institution
    LBNL Berkeley, CA 94720, USA
  • fYear
    2005
  • fDate
    16-20 May 2005
  • Firstpage
    3985
  • Lastpage
    3987
  • Abstract
    Aberration correction of photoemission electron microscopes (PEEM) requires use of a magnetic beam separator. This device is a complex integrated magnetic system and is essentially fixed in its optical properties hence very susceptible to problems caused by mechanical or magnetic imperfections. Here we present a separate function design that is simple to construct, is fully adjustable and gives outstanding performance.
  • Keywords
    Electron beams; Electron microscopy; Electron optics; Integrated optics; Magnetic devices; Magnetic force microscopy; Magnetic separation; Particle separators; Photoelectricity; Photoelectron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 2005. PAC 2005. Proceedings of the
  • Print_ISBN
    0-7803-8859-3
  • Type

    conf

  • DOI
    10.1109/PAC.2005.1591691
  • Filename
    1591691
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3218348