DocumentCode
3218393
Title
Fabrication of cold test system for slow-wave structure
Author
Zhaojun Zhu ; Baofu Jia ; Deming Wan ; Chaolei Wei ; Wang Jian
Author_Institution
Sch. of Phys. Electron., UESTC of China, Chengdu, China
fYear
2010
fDate
14-16 Oct. 2010
Firstpage
301
Lastpage
302
Abstract
Dispersion characteristics and interaction impedance is the key parameter for travelling wave tube design. This paper demonstrate the travelling wave tube method for dispersion test. A helix slow wave structure was chosen as sample for test validation. Also, the test results are compared with the simulations of CST Microwave Studio (MWS) and High Frequency Structure Simulator (HFSS). Test results for the dispersion and the interaction impedance were shown.
Keywords
computational electromagnetics; electromagnetic wave scattering; slow wave structures; testing; CST Microwave Studio; High Frequency Structure Simulator; cold test system; dispersion characteristics; helix slow wave structure; interaction impedance; travelling wave tube method;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location
Nanjing
Print_ISBN
978-1-4244-6645-0
Type
conf
DOI
10.1109/IVESC.2010.5644309
Filename
5644309
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