Title :
Interconnect wire length estimation for stochastic wiring distributions
Author :
Hefeida, Mohamed S. ; Chowdhury, Masud H.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Chicago, Chicago, IL, USA
Abstract :
This paper presents an improved stochastic wiring distribution model. The model is an improvement and modification of the models presented in some prior works available in literature. The proposed model shows 28% - 50% reduction in error when estimating the average interconnect wire length compared to existing models. This paper also investigates the effect of Rent´s exponent on the average wire length estimation. This investigation leads to the identification of some limitations of the approximations found in recent models.
Keywords :
error analysis; integrated circuit interconnections; integrated circuit modelling; integrated logic circuits; stochastic processes; Rent exponent; error reduction; interconnect wire length estimation; interconnection networks; stochastic wiring distribution model; Computer errors; Costs; Helium; Integrated circuit interconnections; Logic gates; Microelectronics; Sockets; Stochastic processes; Wire; Wiring; Average wire length; Rent´s exponent; gate sockets; stochastic wiring distributions;
Conference_Titel :
Microelectronics, 2008. ICM 2008. International Conference on
Conference_Location :
Sharjah
Print_ISBN :
978-1-4244-2369-9
Electronic_ISBN :
978-1-4244-2370-5
DOI :
10.1109/ICM.2008.5393767