DocumentCode
3218829
Title
Simulations of Beam Injection and Extraction into Ion Sources
Author
Cavenago, M.
Author_Institution
INFN-LNL, Legnaro, Italy, cavenago@lnl.infn.it
fYear
2005
fDate
16-20 May 2005
Firstpage
4069
Lastpage
4071
Abstract
Charge breeding, the injection of singly charged ions into Electron Cyclotron Resonance Ion Sources (ECRIS) to extract a highly charged ion beam, is a promising technique for producing beam of rare ions. Efficiency and extracted beam temperature are dominated by the strong collisional diffusion of ions. A program, named ’beam2ecr’, simulating details of the injection, ionization, collision and extraction processes is described. A model of the injection plasma sheath and of source fringe fields is now included and neutral injection is also supported. Results, clearly favouring near axis injection for most cases, are described. Code is written in C-language and with possibility of parallel execution over a Linux cluster.
Keywords
Cyclotrons; Electron beams; Ion beams; Ion sources; Ionization; Linux; Particle beam injection; Plasma sheaths; Plasma temperature; Resonance;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 2005. PAC 2005. Proceedings of the
Print_ISBN
0-7803-8859-3
Type
conf
DOI
10.1109/PAC.2005.1591720
Filename
1591720
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