• DocumentCode
    3219133
  • Title

    Tradeoffs in chip and substrate complexity and cost for field programmable multichip modules

  • Author

    Darnauer, Joel ; Wei-Ming Dai, Wayne

  • Author_Institution
    Dept. of Comput. Eng., California Univ., Santa Cruz, CA, USA
  • fYear
    1996
  • fDate
    9-11 Oct 1996
  • Firstpage
    217
  • Lastpage
    227
  • Abstract
    Field programmable MCMs (FPMCMs) can be used to improve the cost-effectiveness of large logic emulation and reconfigurable computing systems. In this paper, we consider two MCM-D based FPMCMs developed at UCSC to illustrate the impact of chip size on substrate wiring density and module cost. We then present a simple model of an idealized FPMCM that can be used to generate relative cost and yield estimates for different architectures. Architectural implications of this model are presented including the optimal number of chips, effect of chip bonding technology on overall cost, and limits to the integration factor for MCMs. We then briefly consider how increasing CMOS density, and innovative technologies like chip-on-chip and chip stacking might affect substrate density in the near future
  • Keywords
    flip-chip devices; integrated circuit interconnections; integrated circuit layout; integrated circuit yield; lead bonding; multichip modules; programmable logic devices; MCM-D based module; chip bonding technology; chip complexity; chip stacking technology; chip-on-chip technology; cost estimates; field programmable MCM; logic emulation; model; module cost; multichip modules; reconfigurable computing systems; substrate complexity; substrate density; substrate wiring density; yield estimates; Bonding; CMOS logic circuits; CMOS technology; Costs; Emulation; Logic devices; Multichip modules; Packaging; Reconfigurable logic; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Innovative Systems in Silicon, 1996. Proceedings., Eighth Annual IEEE International Conference on
  • Conference_Location
    Austin, TX
  • ISSN
    1063-2204
  • Print_ISBN
    0-7803-3639-9
  • Type

    conf

  • DOI
    10.1109/ICISS.1996.552429
  • Filename
    552429