• DocumentCode
    3219786
  • Title

    Detection of degradation in opaque dielectrics by ultrasound

  • Author

    Auckland, D.W. ; Smith, C.D. ; Varlow, B.R.

  • Author_Institution
    Dept. of Electr. Eng., Manchester Univ., UK
  • fYear
    1992
  • fDate
    22-25 Jun 1992
  • Firstpage
    343
  • Lastpage
    347
  • Abstract
    The applicability of ultrasound methods to the detection of degradation in opaque dielectrics was investigated. The ultrasonic equipment used was a digital ultrasonic flaw detector with five narrow-band frequency ranges and a broadband range of 0.5 MHz and 15 MHz. The majority of experimental samples were made either from polyester resin or polyethylene. The polymers with the best ultrasonic visibility were rigid unfilled synthetic resins whose use in HV (high-voltage) insulation, though limited, is expanding. In such insulation small channels, cracks, and voids were detected with a good resolution at depths of up to 70-80 mm in the insulation. When resins were filled, their ultrasonic visibility was generally diminished. Epoxy resins varied greatly in their characteristics. CT200 has a high Young´s modulus and hence had very good ultrasonic visibility, whereas CY1311, a much less rigid resin used for potting, had very poor ultrasonic visibility. Polyethylene cables, which are generally made from low-density cross-linked material, had fair ultrasonic visibility. The higher density polyethylenes, often used for cable protection, had much better propagation characteristics, making detection of debonding between the two layers very easy
  • Keywords
    flaw detection; organic insulating materials; polymers; ultrasonic materials testing; 0.5 to 15 MHz; HV insulation; Young´s modulus; cracks; cross-linked material; debonding; degradation; digital ultrasonic flaw detector; narrow-band frequency ranges; opaque dielectrics; polyester resin; polyethylene; potting; propagation characteristics; rigid unfilled synthetic resins; ultrasound methods; voids; Cables; Degradation; Detectors; Dielectrics; Frequency; Insulation; Narrowband; Polyethylene; Resins; Ultrasonic imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Solid Dielectrics, 1992., Proceedings of the 4th International Conference on
  • Conference_Location
    Sestri Levante
  • Print_ISBN
    0-7803-0129-3
  • Type

    conf

  • DOI
    10.1109/ICSD.1992.224928
  • Filename
    224928