DocumentCode :
3220070
Title :
Electrostatic focusing Spindt-type FEA for image sensor with HARP target
Author :
Honda, Yuma ; Nanba, M. ; Takiguchi, Y. ; Egami, N. ; Saishu, Y. ; Nakamura, Kentaro ; Taniguchi, Masaaki
Author_Institution :
NHK Sci. & Technol. Res. Labs., Tokyo, Japan
fYear :
2010
fDate :
14-16 Oct. 2010
Firstpage :
105
Lastpage :
106
Abstract :
flat image sensor consisting of a Spindt-type field emitter array (FEA) and a high-gain avalanche rushing amorphous photoconductor (HARP) target has been studied with the aim of developing ultrahigh-sensitivity compact television cameras . This image sensor is called an FEA-HARP sensor. The output signal current of the FEA-HARP sensor is obtained by reading out holes that have accumulated on the HARP target depending on the incident light with scanning electrons emitted sequentially from Spindt-type field emitters (FEs) placed on each pixel. Resolution of the FEA-HARP sensor is determined by the spatial spread of the electrons on the HARP target, and a spread that is wider than the pixel area deteriorates the resolution. While a previous FEA-HARP sensor with a magnetic focusing system that suppresses the spread of the electrons had sufficient resolution, this focusing system needs large cylindrical permanent magnets. Therefore, constructing a compact camera with the previous FEA-HARP sensor is difficult. To overcome this problem, we investigated the feasibility of using an electrostatic focusing system, which has a focusing electrode on a gate electrode instead of magnets.
Keywords :
field emitter arrays; focusing; image sensors; permanent magnets; photoconducting materials; television cameras; FEA; HARP; Spindt-type field emitter array; electrostatic focusing system; flat image sensor; high-gain avalanche rushing amorphous photoconductor; magnetic focusing system; permanent magnets; television cameras; Cathodes; Logic gates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-6645-0
Type :
conf
DOI :
10.1109/IVESC.2010.5644391
Filename :
5644391
Link To Document :
بازگشت