• DocumentCode
    3220083
  • Title

    Graphical model validation methods for analog and mixedsignal electronic circuits design

  • Author

    Hamad, Husam ; Al-Smadi, Adnan ; Ijjeh, Abdallah

  • Author_Institution
    Biomed. Eng. Dept., Jordan Univ. of Sci. & Technol., Jordan
  • fYear
    2008
  • fDate
    14-17 Dec. 2008
  • Firstpage
    353
  • Lastpage
    356
  • Abstract
    Simplified models are used to replace SPICE-based simulation models in analog and mixed-signal electronic circuits design for increased computational efficiency. The increase in computational efficiency usually comes at the expense of reduced model accuracies by comparison to simulation models. Graphical model validation methods can be used to display model and simulation data to complement validation statistics such as root mean square (RMS) error. In this paper, we present three plot types to display data to validate models in analog integrated circuits. These are the so-called circle plots, acceptance-score-distribution (ASD) plots, and ordinal plots. These plots are general and easy to generate using the same validation sample used to calculate other statistics, e.g., RMS errors; no extra simulation expenses are incurred. Furthermore, unlike quantitative statistics used for model validation, the methods presented require no statistical assumptions for the data that can be displayed.
  • Keywords
    electronic engineering computing; integrated circuit modelling; mean square error methods; mixed analogue-digital integrated circuits; acceptance-score-distribution plot; analog circuit design; analog integrated circuits; circle plot; graphical model validation; mixed-signal electronic circuit design; ordinal plot; root mean square error; Analog integrated circuits; Circuit simulation; Computational efficiency; Computational modeling; Displays; Electronic circuits; Error analysis; Graphical models; Integrated circuit modeling; Root mean square; Analog circuits modeling; model validation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 2008. ICM 2008. International Conference on
  • Conference_Location
    Sharjah
  • Print_ISBN
    978-1-4244-2369-9
  • Electronic_ISBN
    978-1-4244-2370-5
  • Type

    conf

  • DOI
    10.1109/ICM.2008.5393849
  • Filename
    5393849