• DocumentCode
    3220143
  • Title

    Sn2.5Ag0.5Cu lead free solder balls with "Ge" and "Ni"

  • Author

    Lee, Redwood ; Sin, Wha Soo ; Jeon, Jong Keun ; Kim, Heui Seog

  • Author_Institution
    Device Packaging Center, Samsung Electron. Ltd., Asan, South Korea
  • fYear
    2005
  • fDate
    16-18 March 2005
  • Firstpage
    121
  • Lastpage
    125
  • Abstract
    Recently, environmental-friendly products have significantly increased the development of lead free solder material. Some products are already in production and most of semiconductors will be released lead-freely. Among the various lead-free solders, the SnAgCu family of solders has been known as one of the leading candidates for high volume mass-production. However, SnAgCu still has a discoloration issue during ir-reflow and burn-in test, and the market requires stronger solder joint for fatigue bending and impact test due to the mobile electronics. In this paper, the countermeasure with adding "Ge" and "Ni" to prevent SnAgCu solder balls from discoloration is investigated and the optimization(3.0 → 2.5%) of the weight ratio of "Ag" contents to enhance solder joint for fatigue bending and impact test is studied and reliability test for the optimized Sn2.5Ag0.5Cu composition is investigated.
  • Keywords
    bending; copper alloys; germanium; impact testing; nickel; reliability; silver alloys; solders; tin alloys; Ge; Ni; SnAgCu; burn-in test; discoloration; environmental-friendly products; fatigue bending; high volume mass-production; impact testing; ir-reflow; lead free solder balls; mobile electronics; reliability test; solder joint; weight ratio; Consumer electronics; Electronic equipment testing; Environmentally friendly manufacturing techniques; Fatigue; High temperature superconductors; Impurities; Lead compounds; Mass production; Soldering; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties and Interfaces, 2005. Proceedings. International Symposium on
  • ISSN
    1550-5723
  • Print_ISBN
    0-7803-9085-7
  • Electronic_ISBN
    1550-5723
  • Type

    conf

  • DOI
    10.1109/ISAPM.2005.1432060
  • Filename
    1432060