Title :
Application of the MEBS SOURCE software package to high voltage electron gun design
Author :
Munro, E. ; Zhu, Xinen ; Rouse, J.
Author_Institution :
MEBS Ltd., London, UK
Abstract :
We report on results of the high-voltage electron guns modeling with MEBS SOURCE software, where not only gun electron-optical properties, but high-voltage isolation have been analyzed and optimized successfully.
Keywords :
electrical engineering computing; electron guns; electron optics; finite element analysis; software packages; MEBS SOURCE software package; SOURCEEF program; electron gun modeling; electron-optical properties; electrostatic potential distribution; high voltage electron gun design; high-voltage isolation; insulator E-field distribution; second-order finite element approach; triple-junction areas; Application software; Electron beams; Electron guns; Electron optics; Electrostatics; Insulation; Optical design; Software packages; Stimulated emission; Voltage;
Conference_Titel :
Vacuum Electronics Conference, 2004. IVEC 2004. Fifth IEEE International
Print_ISBN :
0-7803-8261-7
DOI :
10.1109/IVELEC.2004.1316356
