• DocumentCode
    3220737
  • Title

    A new computer-aided measuring system for fundamental PD-studies

  • Author

    Kurrat, M. ; Schnettler, A.

  • Author_Institution
    Inst. of High Voltage Eng., Dortmund Univ., Germany
  • fYear
    1992
  • fDate
    22-25 Jun 1992
  • Firstpage
    166
  • Lastpage
    170
  • Abstract
    PD (partial discharge) monitoring in combination with time-resolved measurements is demonstrated to be a suitable tool for insulation diagnosis. Apart from statistical interpretations of phase-resolved PD patterns for fault recognition, description of material degradation and prediction of lifetime expectancy is desired. Time-resolved measurements yield information about physical processes within the insulation and can be used to explain the coherence between measured PD parameters, their statistical analysis, and the inner processes. PD quantities such as inception field strength, maximum apparent charge, and surface charge at the void walls are calculated and compared with experimental results. Numerical simulations of PD patterns for a void within polyethylene based upon these calculations are in good accordance with measured ones
  • Keywords
    automatic test equipment; computerised monitoring; fault location; insulation testing; partial discharges; PD monitoring; computer-aided measuring system; fault recognition; inception field strength; insulation diagnosis; lifetime expectancy; material degradation; maximum apparent charge; partial discharge; phase-resolved PD patterns; polyethylene; statistical analysis; surface charge; time-resolved measurements; void walls; Circuit testing; Current measurement; Cutoff frequency; Frequency measurement; Partial discharge measurement; Partial discharges; Pulse measurements; Time measurement; Voltage; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Solid Dielectrics, 1992., Proceedings of the 4th International Conference on
  • Conference_Location
    Sestri Levante
  • Print_ISBN
    0-7803-0129-3
  • Type

    conf

  • DOI
    10.1109/ICSD.1992.224984
  • Filename
    224984