DocumentCode :
322089
Title :
Computer Vision Algorithms For Pre-cap I.C. Inspection
Author :
Wong, E.M.C. ; Koh, L.M. ; Heng, A.S. ; Tan, K.T.
Author_Institution :
Nanyang Technological Institute
Volume :
1
fYear :
1988
fDate :
24-28 Oct. 1988
Firstpage :
217
Lastpage :
222
Keywords :
Assembly systems; Automation; Circuit testing; Computer vision; Image segmentation; Inspection; Integrated circuit technology; Integrated circuit testing; Visual databases; Welding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics Society, 1988. IECON '88. Proceedings., 14 Annual Conference of
Conference_Location :
Singapore
Type :
conf
DOI :
10.1109/IECON.1988.662371
Filename :
662371
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=322089
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