• DocumentCode
    3220919
  • Title

    Development of nanocomposite lead-free electronic solders

  • Author

    Lee, Jong-Gi ; Subramanian, K.N. ; Jong-Gi Lee

  • Author_Institution
    Dept. of Chem. Eng. & Mater. Sci., Michigan State Univ., Lansing, MI, USA
  • fYear
    2005
  • fDate
    16-18 March 2005
  • Firstpage
    276
  • Lastpage
    281
  • Abstract
    Inert, hybrid inorganic/organic, nano-structured chemicals, can be incorporated into low melting metallic materials, such as lead-free electronic solders to achieve desired level of performance. The nano-structured materials technology of polyhedral oligomeric silsesquioxanes (POSS), with appropriate organic groups, can produce suitable means to promote bonding between nano-reinforcements and the metallic matrix. The microstructures of lead-free solder with surface-active POSS tri-silanols were evaluated using scanning electron microscopy (SEM). Wettability of POSS-containing lead-free solders to copper substrate was also examined. Steady-state deformation of solder joints made of eutectic Sn-Ag solder with varying weight fraction of POSS of different chemical moieties were evaluated at a range of temperatures (25°C, 100°C, and 150°C) using a Rheometric Solids Analyzer (RSA-III). Mechanical properties such as shear stress versus simple shear-strain relationships, peak shear stress as a function of rate of simple shear-strain and testing temperature were reported. The service reliability of joints made with these newly formulated nanocomposite solders was evaluated using a realistic thermomechanical fatigue (TMF) profile. Evolution of microstructures and residual mechanical property at different extend of TMF cycles were compared with joints made of standard, un-reinforced eutectic Sn-Ag solder.
  • Keywords
    copper; crystal microstructure; eutectic alloys; lead; mechanical properties; nanocomposites; organic insulating materials; reliability; scanning electron microscopy; silver alloys; soldering equipment; solders; thermomechanical treatment; tin alloys; wetting; 25 to 150 C; POSS; Pb; RSA-III; Rheometric Solids Analyzer; Sn-Ag; copper substrate; eutectic tin-silver solder; lead-free electronic solders; mechanical property; microstructure; nanocomposite electronic solders; nanoreinforcements; nanostructured materials; polyhedral oligomeric silsesquioxanes; scanning electron microscopy; service reliability; shear stress; shear-strain relationship; solder joints; steady-state deformation; thermomechanical fatigue profile; wettability; Chemical analysis; Environmentally friendly manufacturing techniques; Inorganic chemicals; Lead; Mechanical factors; Microstructure; Organic chemicals; Residual stresses; Scanning electron microscopy; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties and Interfaces, 2005. Proceedings. International Symposium on
  • ISSN
    1550-5723
  • Print_ISBN
    0-7803-9085-7
  • Electronic_ISBN
    1550-5723
  • Type

    conf

  • DOI
    10.1109/ISAPM.2005.1432089
  • Filename
    1432089