DocumentCode :
3221054
Title :
Enhanced field emission from the contact between metal and dielectric
Author :
Chung, M.S. ; Yoon, Byung-Jun ; Mayer, Arnaldo ; Weiss, B.L. ; Miskovsky, N.M. ; Cutler, P.H.
Author_Institution :
Dept. of Phys., Univ. of Ulsan, Ulsan, South Korea
fYear :
2010
fDate :
14-16 Oct. 2010
Firstpage :
21
Lastpage :
22
Abstract :
We have investigated the enhanced field emission at the contact between metal and dielectric. Such a strong enhancement of field emission has been often observed as a breakdown and is considered to be due to dielectric [1]. It seems that the enhancement of emission has two reasons [2]. One is the polarization of dielectric due to the charge on the metal. The polarization charges, in return, attract free charges on the metal toward the junction, which leads to the high surface charge density near the junction. The other is the space charges produced by the very enhanced field, in dielectric. Due to a lot of space charges, the contact barrier between metal and dielectric is thinned and lowered, which leads to the production of a detour path from metal through dielectric to vacuum. The detour path can be more preferable by the view of potential energy than the direct path from metal-vacuum. We evaluate the two effects to explain the enhancement of field emission in problem.
Keywords :
dielectric materials; dielectric polarisation; electric breakdown; electron field emission; metal-insulator boundaries; metals; space charge; contact barrier; detour path production; dielectric breakdown; dielectric polarization; field emission enhancement; metal charge; polarization charges; potential energy; space charges; surface charge density; Lead;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electron Sources Conference and Nanocarbon (IVESC), 2010 8th International
Conference_Location :
Nanjing
Print_ISBN :
978-1-4244-6645-0
Type :
conf
DOI :
10.1109/IVESC.2010.5644437
Filename :
5644437
Link To Document :
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