Title :
BIST testability enhancement using high level test synthesis for behavioral and structural designs
Author :
Lai, Kowen ; Papachrist, Christos A. ; Baklashov, Mikhail
Author_Institution :
Rockwell Semicond. Syst., Newport Beach, CA, USA
Abstract :
In this paper we will show how high level test synthesis can achieve higher testability for BIST oriented test methodologies. Our results show considering testability during high-level synthesis, better testability can be obtained when compared to DFT at low level
Keywords :
built-in self test; design for testability; high level synthesis; logic testing; BIST testability; DFT; behavioral designs; controllability; fidelity; high level test synthesis; industrial benchmark; observability; structural designs; transparency; Built-in self-test; Circuit synthesis; Circuit testing; Controllability; Design for testability; High level synthesis; Observability; Semiconductor device testing; Signal synthesis; System testing;
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita
Print_ISBN :
0-8186-8209-4
DOI :
10.1109/ATS.1997.643980
