DocumentCode :
3221221
Title :
New results on high perfection langasite crystals: studies of crystalline defects and mode shapes
Author :
Zarka, A. ; Capelle, B. ; Detaint, J. ; Cochet-Muchy, D.
Author_Institution :
CNRS, Paris, France
fYear :
1995
fDate :
31 May-2 Jun 1995
Firstpage :
629
Lastpage :
637
Abstract :
Langasite (LGS: La3Ga5SiO14) is a new piezoelectric material obtained by the Czochralski method. In this paper we present results obtained on new samples which are more representative of the crystalline quality achieved with this material. Observations using X-ray transmission topography have permitted verification of the quality of samples of different origins and to analyse the nature of their crystalline defects. Vibration modes of different types of devices made with LGS have been studied by X-ray transmission topography. This study was essentially concerned with plane or plano-convex resonators. This material has interesting properties and among them compensated cuts with a large coupling coefficient and a very reduced angular sensitivity
Keywords :
X-ray topography; crystal defects; crystal growth from melt; crystal resonators; gallium compounds; lanthanum compounds; piezoelectric materials; Czochralski method; La3Ga5SiO14; X-ray transmission topography; angular sensitivity; coupling coefficient; crystalline defects; langasite; mode shapes; piezoelectric material; plano-convex resonators; vibration modes; Couplings; Crystalline materials; Crystallization; Crystals; Diffraction; Electrodes; Piezoelectric materials; Shape; Solvents; Surface topography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1995. 49th., Proceedings of the 1995 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-2500-1
Type :
conf
DOI :
10.1109/FREQ.1995.484064
Filename :
484064
Link To Document :
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