Precise methods for the measurement of fundamental characteristics of SAW in crystals

Author

Kolosovsky, E.A. ; Tsarev, A.V. ; Yakovkin, I.B.

Author_Institution

Inst. of Semicond. Phys., Acad. of Sci., Novosibirsk, Russia

Volume

1

fYear

1997

fDate

5-8 Oct 1997

Firstpage

231

Abstract

This work is devoted to the investigation of two novel precise acoustooptics (AO) methods for the measurement of fundamental characteristics of surface acoustic waves (SAW) in crystals. The first method is based on application of multisectional (MS) comb filter that utilizes the effect of multiple acoustic interference. SAW phase velocity and its dispersion are determined by precise measurement of trap frequencies of narrow interference peaks of the frequency response. The method combines simplicity and convenience of application with the high accuracy. The second method is based on interference of two spatially separated light beams that diffracted from different parts of the SAW. The velocity of the SAW is determined by measurement of dynamic change of the interference pattern´s intensity versus SAW´s frequency. Advantages of this method are moderate accuracy (about 0.02%) and unique opportunity of simultaneous measuring the phase and the group SAW velocities, as well as the dispersion

Keywords

acoustic wave interference; acousto-optical effects; light diffraction; surface acoustic wave filters; surface acoustic waves; ultrasonic velocity measurement; SAW; SAW frequency; SAW phase velocity; acoustooptics; crystals; dispersion; fundamental characteristics; group velocities; interference pattern intensity; multiple acoustic interference; multisectional comb filter; phase velocities; spatially separated light beams; surface acoustic waves; trap frequencies; Acoustic measurements; Acoustic waves; Crystals; Dispersion; Filters; Frequency measurement; Interference; Phase measurement; Surface acoustic waves; Velocity measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultrasonics Symposium, 1997. Proceedings., 1997 IEEE

Conference_Location

Toronto, Ont.

ISSN

1051-0117

Print_ISBN

0-7803-4153-8

Type

conf

DOI

10.1109/ULTSYM.1997.663016

Filename

663016