Title :
An extended march test algorithm for embedded memories
Author :
Park, Gang-Min ; Chang, Hoon
Author_Institution :
Dept. of Comput. Sci., Soongsil Univ., Seoul, South Korea
Abstract :
In this paper, an efficient test algorithm and BIST architecture for embedded memories are presented. The proposed test algorithm can fully detect stuck-at fault, transition fault, coupling fault. Moreover, the proposed test algorithm can detect neighborhood pattern sensitive fault, which could not be detected in previous march test algorithms. The proposed test algorithm performs testing for neighborhood pattern sensitive fault using background data, which has been used for word-oriented memory testing
Keywords :
automatic testing; built-in self test; fault location; hardware description languages; integrated circuit testing; integrated memory circuits; BIST architecture; background data; coupling fault; efficient test algorithm; embedded memories; extended march test algorithm; neighborhood pattern sensitive fault; stuck-at fault; transition fault; word-oriented memory testing; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic testing; Performance evaluation; Read-write memory; System testing;
Conference_Titel :
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian
Conference_Location :
Akita
Print_ISBN :
0-8186-8209-4
DOI :
10.1109/ATS.1997.643990
