DocumentCode :
3221647
Title :
Fatigue tests of Ni-P amorphous alloy microcantilever beams
Author :
Maekawa, S. ; Takashima, K. ; Shimojo, M. ; Higo, Y. ; Sugiura, S. ; Pfister, B. ; Swain, M.V.
Author_Institution :
Precision & Intelligence Lab., Tokyo Inst. of Technol., Japan
fYear :
1999
fDate :
6-8 July 1999
Firstpage :
132
Lastpage :
133
Abstract :
Development of micromachines and MEMS (microelectromechanical system) devices are making steady progress at present. The size of components used in these micromachines and MEMS devices is expected to be of the order of μm, and the mechanical properties of such materials may be different from those of bulk materials. Therefore, the evaluation of mechanical properties such as Young´s modulus, tensile strength and fatigue properties is essential for the design of micromachines and MEMS devices. Young´s modulus, fracture stress and hardness of thin films and small elements of silicon single crystals have been measured. In addition to modulus and strength of such micro-sized materials, the fatigue properties are extremely important to design micromachines and MEMS devices. However, there have been few fatigue data for micro-sized materials, and the fatigue properties of such materials are still unclear. In the present study, fatigue life and fatigue crack propagation tests have been performed on Ni-P amorphous alloy microcantilever beams by using a newly developed fatigue testing machine.
Keywords :
amorphous state; fatigue; fatigue testing; micromechanical devices; nickel alloys; phosphorus alloys; MEMS; Ni-P; Young´s modulus; amorphous alloy; fatigue crack propagation; fatigue life; fatigue tests; fracture stress; hardness; microcantilever beams; micromachines; tensile strength; Amorphous materials; Crystalline materials; Fatigue; Life testing; Mechanical factors; Microelectromechanical devices; Microelectromechanical systems; Micromechanical devices; Semiconductor thin films; Tensile stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 1999. Digest of Papers. Microprocesses and Nanotechnology '99. 1999 International
Conference_Location :
Yokohama, Japan
Print_ISBN :
4-930813-97-2
Type :
conf
DOI :
10.1109/IMNC.1999.797512
Filename :
797512
Link To Document :
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