DocumentCode :
3221737
Title :
Dependence of frequency-temperature characteristics of quartz resonators on form, dimensions and local variations of thickness of piezoelectric crystal
Author :
Postnikov, I.I.
Author_Institution :
Moscow Power Eng. Inst., Russia
fYear :
1995
fDate :
31 May-2 Jun 1995
Firstpage :
804
Lastpage :
809
Abstract :
An algorithm and computing program for solving a boundary-value problem are developed to determine temperature dependencies of eigenvalues and eigenfunctions of quartz resonators with rotated Y-cut piezoelectric crystals with axial symmetry and varying thickness. The possibility of determining of these dependencies is demonstrated for crystals with varying thickness and different cut directions for both harmonic and nonharmonic vibrations
Keywords :
boundary-value problems; crystal resonators; eigenvalues and eigenfunctions; harmonic oscillators (circuits); quartz; SiO2; axial symmetry; boundary-value problem; cut directions; eigenfunctions; eigenvalues; frequency-temperature characteristics; harmonic vibrations; local thickness variations; nonharmonic vibrations; piezoelectric crystal; quartz resonators; rotated Y-cut; temperature dependencies; Crystals; Elasticity; Lab-on-a-chip; Power engineering; Power engineering computing; Resonance; Resonant frequency; Temperature dependence; Temperature distribution; Vibration measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1995. 49th., Proceedings of the 1995 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-2500-1
Type :
conf
DOI :
10.1109/FREQ.1995.484088
Filename :
484088
Link To Document :
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