Application of a Sagnac interferometer for the characterization of scattered ultrasonic fields

Author

Fomitchov, Pavel A. ; Kromine, Alexei ; Krishnaswamy, Sridhar ; Achenbach, Jan D.

Author_Institution

Center for Quality Eng. & Failure Prevention, Northwestern Univ., Evanston, IL, USA

Volume

1

fYear

1997

fDate

5-8 Oct 1997

Firstpage

609

Abstract

Knowledge of the spatial and temporal parameters of ultrasonic beams, as well as details of interaction of such beams with small defects is necessary for effective application of ultrasonic techniques to nondestructive evaluation (NDE). The work presented here employs a fiber-optic Sagnac interferometer to characterize acoustical fields generated by conventional piezoelectric transducers (PZT) and a laser ultrasonic source, and the scattering of such ultrasonic fields by flaws. The high spatial resolution of this interferometer and its ability to provide absolute ultrasonic displacements make this device very suitable for: (i) profiling and calibration of ultrasonic beams generated by PZT transducers or laser sources, and (ii) precision measurement of ultrasonic fields scattered by flaws

Keywords

calibration; fibre optic sensors; flaw detection; lead compounds; light interferometers; piezoceramics; piezoelectric transducers; ultrasonic materials testing; ultrasonic scattering; PZT; PZT transducers; PbZrO3TiO3; absolute ultrasonic displacements; acoustical fields; calibration; conventional piezoelectric transducers; fiber-optic Sagnac interferometer; flaws; laser ultrasonic source; nondestructive evaluation; precision measurement; profiling; scattered ultrasonic fields; scattering; small defects; spatial parameters; spatial resolution; temporal parameters; ultrasonic beams; ultrasonic techniques; Acoustic beams; Acoustic scattering; Character generation; Fiber lasers; Laser beams; Optical fiber devices; Piezoelectric transducers; Sagnac interferometers; Spatial resolution; Ultrasonic imaging;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultrasonics Symposium, 1997. Proceedings., 1997 IEEE

Conference_Location

Toronto, Ont.

ISSN

1051-0117

Print_ISBN

0-7803-4153-8

Type

conf

DOI

10.1109/ULTSYM.1997.663095

Filename

663095