DocumentCode
3223530
Title
Sharp disparity reconstruction using sparse disparity measurement and color information
Author
Lee-Kang Liu ; Zucheul Lee ; Nguyen, Thin
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, La Jolla, CA, USA
fYear
2013
fDate
10-12 June 2013
Firstpage
1
Lastpage
4
Abstract
Recently, the work on dense disparity map reconstruction from 5% sparse initial estimates containing edges in disparity, has been proposed [1]. Practically, however, edges in disparity is unknown unless a dense disparity map has already been generated. In this paper, we present a realistic reconstruction framework for obtaining sharp and dense disparity maps from fixed number of sparse initial estimates with the aid of color image information. Experimental results show that sharp and dense disparity maps can be reconstructed at the cost of one pixel accuracy.
Keywords
edge detection; image colour analysis; image reconstruction; color image information; color information; dense disparity map reconstruction; edge detection; sharp disparity reconstruction; sparse disparity measurement; Accuracy; Color; Estimation; Image color analysis; Image edge detection; Image reconstruction; Semiconductor device measurement; Compressive Sensing; Disparity; Edge Detection; Sparse Reconstruction; Sparsity;
fLanguage
English
Publisher
ieee
Conference_Titel
IVMSP Workshop, 2013 IEEE 11th
Conference_Location
Seoul
Type
conf
DOI
10.1109/IVMSPW.2013.6611899
Filename
6611899
Link To Document