• DocumentCode
    3223530
  • Title

    Sharp disparity reconstruction using sparse disparity measurement and color information

  • Author

    Lee-Kang Liu ; Zucheul Lee ; Nguyen, Thin

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California, San Diego, La Jolla, CA, USA
  • fYear
    2013
  • fDate
    10-12 June 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Recently, the work on dense disparity map reconstruction from 5% sparse initial estimates containing edges in disparity, has been proposed [1]. Practically, however, edges in disparity is unknown unless a dense disparity map has already been generated. In this paper, we present a realistic reconstruction framework for obtaining sharp and dense disparity maps from fixed number of sparse initial estimates with the aid of color image information. Experimental results show that sharp and dense disparity maps can be reconstructed at the cost of one pixel accuracy.
  • Keywords
    edge detection; image colour analysis; image reconstruction; color image information; color information; dense disparity map reconstruction; edge detection; sharp disparity reconstruction; sparse disparity measurement; Accuracy; Color; Estimation; Image color analysis; Image edge detection; Image reconstruction; Semiconductor device measurement; Compressive Sensing; Disparity; Edge Detection; Sparse Reconstruction; Sparsity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IVMSP Workshop, 2013 IEEE 11th
  • Conference_Location
    Seoul
  • Type

    conf

  • DOI
    10.1109/IVMSPW.2013.6611899
  • Filename
    6611899