DocumentCode :
3224649
Title :
Material engineering in phase-change memory for low power consumption and multi-level storage
Author :
Yin, You ; Noguchi, Tomoyuki ; Ohno, Hiroki ; Hosaka, Sumio
Author_Institution :
Dept. of Production Sci. & Technol., Gunma Univ., Kiryu, Japan
fYear :
2009
fDate :
25-27 Dec. 2009
Firstpage :
449
Lastpage :
452
Abstract :
We investigated the influence of the phase-change materials on the performance of memory devices for low power consumption and multi-level storage. Doping N into chalcogenide phase-change materials results in higher resistivity and low-response for temperature. The former characteristic leads to high heating efficiency for phase change and thus reduces the power consumption to about 1/10. The latter characteristic makes it easier to control phase change process in the memory device for multi-level storage. By adopting a top heater structure, 16 distinct resistance levels are demonstrated in our lateral device.
Keywords :
crystallisation; low-power electronics; nitrogen; phase change materials; phase change memories; chalcogenide phase-change materials; multi-level storage; phase-change memories; resistance levels; Conductivity; Doping; Energy consumption; Heating; Material storage; Phase change materials; Phase change memory; Power engineering and energy; Process control; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits, 2009. EDSSC 2009. IEEE International Conference of
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-4297-3
Electronic_ISBN :
978-1-4244-4298-0
Type :
conf
DOI :
10.1109/EDSSC.2009.5394221
Filename :
5394221
Link To Document :
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