Title :
3D nanorobotic manipulations of multi-walled carbon nanotubes
Author :
Dong, Lixin ; Arai, Fumihito ; Fukuda, Toshio
Author_Institution :
Dept. of Micro Syst. Eng., Nagoya Univ., Japan
Abstract :
Multi-walled carbon nanotubes (MWNTs) are manipulated in 3D space with a 10-DOF nanorobotic manipulator, which is actuated with PZTs and PicomotorsTM (New Focus Inc.) and operated inside a scanning electronic microscope (SEM). The coarse linear resolutions of the manipulator are better than 30 nm (X, Y, Z stages actuated by Picomotors) and the rotary one 2 mrad, while the resolutions of fine motions (actuated by PZTs) are within nano-order. AFM cantilevers are used as the end-effector. Several kinds of manipulations of MWNTs are performed with the developed manipulators with the assistance of dielectrophoresis and van der Waals forces. A single MWNT with estimated dimensions of φ 40 nm ×7 μm has been picked up on an AFM cantilever. Another φ 50 nm ×6 μm MWNT is placed between two cantilevers, and still another φ 40 nm ×8 μm MWNT is bent between a cantilever and sample substrate. Carbon nanotube (CNT) junctions are basic building blocks for more complex devices based on CNTs. A cross-junction was constructed with two MWNTs of dimensions of ∼φ 40 nm ×6 μm and ∼φ 50 nm ×7 μm, and a T-junction was made of two MWNTs with the dimensions of ∼φ 40 nm ×3 μm and ∼φ 50 nm ×2 μm. Force measurements are performed and the flexural rigidity and Young´s modulus of an ∼φ 30 nm ×7 μm MWNT are estimated to be 8.641×10-20 Nm2 and 2.17 TPa respectively. Such manipulations are essential for both the property research of CNTs and the fabrication of CNT-based NEMS.
Keywords :
Young´s modulus; atomic force microscopy; carbon nanotubes; electrophoresis; force measurement; micromanipulators; micromotors; micropositioning; nanotechnology; scanning electron microscopy; van der Waals forces; 10 DOF nanorobotic manipulator; 2 to 8 mum; 30 to 50 nm; 3D nanorobotic manipulations; AFM cantilevers; C; Picomotors; T-junction; Young´s modulus; carbon nanotube junctions; cross-junction; dielectrophoresis; end-effector; flexural rigidity; multi-walled carbon nanotubes; scanning electronic microscope; van der Waals forces; Atomic force microscopy; Carbon nanotubes; End effectors; Manipulators; Mechanical factors; Nanobioscience; Nanotechnology; Probes; Quantum mechanics; Substrates;
Conference_Titel :
Robotics and Automation, 2001. Proceedings 2001 ICRA. IEEE International Conference on
Print_ISBN :
0-7803-6576-3
DOI :
10.1109/ROBOT.2001.932621